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Title: Evaluation of built-in test - Aerospace and Electronic Systems, IEEE Tra nsactions on Author: IEEE Created Date: 3/22/2001 11:46:19 AM Title: Evaluation of built-in test - Aerospace and Electronic Systems, IEEE Tra nsactions on Author: IEEE Created Date: 3/22/2001 11:46:19 AM
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This report summarizes available information of use in designing built-in-test (BIT) capabilities in electronic systems. It describes the various types of BIT, design This report summarizes available information of use in designing built-in-test (BIT) capabilities in electronic systems. It describes the various types of BIT, design
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